Daily Papers

During industrial processing, unforeseen defects may arise in products due to uncontrollable factors. Although unsupervised methods have been successful in defect localization, the usual use of pre-trained models results in low-resolution outputs, which damages visual performance. To address this issue, we propose PyramidFlow, the first fully normalizing flow method without pre-trained models that enables high-resolution defect localization. Specifically, we propose a latent template-based defect contrastive localization paradigm to reduce intra-class variance, as the pre-trained models do. In addition, PyramidFlow utilizes pyramid-like normalizing flows for multi-scale fusing and volume normalization to help generalization. Our comprehensive studies on MVTecAD demonstrate the proposed method outperforms the comparable algorithms that do not use external priors, even achieving state-of-the-art performance in more challenging BTAD scenarios.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

We propose Neural Field Thermal Tomography (NeFTY), a differentiable physics framework for the quantitative 3D reconstruction of material properties from transient surface temperature measurements. While traditional thermography relies on pixel-wise 1D approximations that neglect lateral diffusion, and soft-constrained Physics-Informed Neural Networks (PINNs) often fail in transient diffusion scenarios due to gradient stiffness, NeFTY parameterizes the 3D diffusivity field as a continuous neural field optimized through a rigorous numerical solver. By leveraging a differentiable physics solver, our approach enforces thermodynamic laws as hard constraints while maintaining the memory efficiency required for high-resolution 3D tomography. Our discretize-then-optimize paradigm effectively mitigates the spectral bias and ill-posedness inherent in inverse heat conduction, enabling the recovery of subsurface defects at arbitrary scales. Experimental validation on synthetic data demonstrates that NeFTY significantly improves the accuracy of subsurface defect localization over baselines. Additional details at https://cab-lab-princeton.github.io/nefty/

Code review is a cornerstone of software quality assurance, and recent advances in Large Language Models (LLMs) have shown promise in its automation. However, existing benchmarks for LLM-based code review face three major limitations. Lack of semantic context: most benchmarks provide only code diffs without textual information such as issue descriptions, which are crucial for understanding developer intent. Data quality issues: without rigorous validation, many samples are noisy-e.g., reviews on outdated or irrelevant code-reducing evaluation reliability. Coarse granularity: most benchmarks operate at the file or commit level, overlooking the fine-grained, line-level reasoning essential for precise review. We introduce ContextCRBench, a high-quality, context-rich benchmark for fine-grained LLM evaluation in code review. Our construction pipeline comprises: Raw Data Crawling, collecting 153.7K issues and pull requests from top-tier repositories; Comprehensive Context Extraction, linking issue-PR pairs for textual context and extracting the full surrounding function or class for code context; and Multi-stage Data Filtering, combining rule-based and LLM-based validation to remove outdated, malformed, or low-value samples, resulting in 67,910 context-enriched entries. ContextCRBench supports three evaluation scenarios aligned with the review workflow: hunk-level quality assessment, line-level defect localization, and line-level comment generation. Evaluating eight leading LLMs (four closed-source and four open-source) reveals that textual context yields greater performance gains than code context alone, while current LLMs remain far from human-level review ability. Deployed at ByteDance, ContextCRBench drives a self-evolving code review system, improving performance by 61.98% and demonstrating its robustness and industrial utility. https://github.com/kinesiatricssxilm14/ContextCRBench.

In this paper, we introduce a new benchmark for continual learning in anomaly detection, aimed at better reflecting real-world deployment scenarios. Our benchmark, Continual-MEGA, includes a large and diverse dataset that significantly expands existing evaluation settings by combining carefully curated existing datasets with our newly proposed dataset, ContinualAD. In addition to standard continual learning with expanded quantity, we propose a novel scenario that measures zero-shot generalization to unseen classes, those not observed during continual adaptation. This setting poses a new problem setting that continual adaptation also enhances zero-shot performance. We also present a unified baseline algorithm that improves robustness in few-shot detection and maintains strong generalization. Through extensive evaluations, we report three key findings: (1) existing methods show substantial room for improvement, particularly in pixel-level defect localization; (2) our proposed method consistently outperforms prior approaches; and (3) the newly introduced ContinualAD dataset enhances the performance of strong anomaly detection models. We release the benchmark and code in https://github.com/Continual-Mega/Continual-Mega.

Multimodal Large Language Models (MLLMs) have achieved impressive success in natural visual understanding, yet they consistently underperform in industrial anomaly detection (IAD). This is because MLLMs trained mostly on general web data differ significantly from industrial images. Moreover, they encode each image independently and can only compare images in the language space, making them insensitive to subtle visual differences that are key to IAD. To tackle these issues, we present AD-Copilot, an interactive MLLM specialized for IAD via visual in-context comparison. We first design a novel data curation pipeline to mine inspection knowledge from sparsely labeled industrial images and generate precise samples for captioning, VQA, and defect localization, yielding a large-scale multimodal dataset Chat-AD rich in semantic signals for IAD. On this foundation, AD-Copilot incorporates a novel Comparison Encoder that employs cross-attention between paired image features to enhance multi-image fine-grained perception, and is trained with a multi-stage strategy that incorporates domain knowledge and gradually enhances IAD skills. In addition, we introduce MMAD-BBox, an extended benchmark for anomaly localization with bounding-box-based evaluation. The experiments show that AD-Copilot achieves 82.3% accuracy on the MMAD benchmark, outperforming all other models without any data leakage. In the MMAD-BBox test, it achieves a maximum improvement of 3.35times over the baseline. AD-Copilot also exhibits excellent generalization of its performance gains across other specialized and general-purpose benchmarks. Remarkably, AD-Copilot surpasses human expert-level performance on several IAD tasks, demonstrating its potential as a reliable assistant for real-world industrial inspection. All datasets and models will be released for the broader benefit of the community.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Pavement defect detection faces critical challenges including limited annotated data, domain shift between training and deployment environments, and high variability in defect appearances across different road conditions. We propose RoadFusion, a framework that addresses these limitations through synthetic anomaly generation with dual-path feature adaptation. A latent diffusion model synthesizes diverse, realistic defects using text prompts and spatial masks, enabling effective training under data scarcity. Two separate feature adaptors specialize representations for normal and anomalous inputs, improving robustness to domain shift and defect variability. A lightweight discriminator learns to distinguish fine-grained defect patterns at the patch level. Evaluated on six benchmark datasets, RoadFusion achieves consistently strong performance across both classification and localization tasks, setting new state-of-the-art in multiple metrics relevant to real-world road inspection.

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect scale and morphology, resulting in limited generalization, degraded realism, and category consistency. We address these challenges by introducing UDG, a large-scale dataset of 300K normal-abnormal-mask-caption quadruplets spanning diverse domains, and by presenting UniDG, a universal defect generation foundation model that supports both reference-based defect generation and text instruction-based defect editing without per-category fine-tuning. UniDG performs Defect-Context Editing via adaptive defect cropping and structured diptych input format, and fuses reference and target conditions through MM-DiT multimodal attention. A two-stage training strategy, Diversity-SFT followed by Consistency-RFT, further improves diversity while enhancing realism and reference consistency. Extensive experiments on MVTec-AD and VisA show that UniDG outperforms prior few-shot anomaly generation and image insertion/editing baselines in synthesis quality and downstream single- and multi-class anomaly detection/localization. Code will be available at https://github.com/RetoFan233/UniDG.

The impact of soiling on solar panels is an important and well-studied problem in renewable energy sector. In this paper, we present the first convolutional neural network (CNN) based approach for solar panel soiling and defect analysis. Our approach takes an RGB image of solar panel and environmental factors as inputs to predict power loss, soiling localization, and soiling type. In computer vision, localization is a complex task which typically requires manually labeled training data such as bounding boxes or segmentation masks. Our proposed approach consists of specialized four stages which completely avoids localization ground truth and only needs panel images with power loss labels for training. The region of impact area obtained from the predicted localization masks are classified into soiling types using the webly supervised learning. For improving localization capabilities of CNNs, we introduce a novel bi-directional input-aware fusion (BiDIAF) block that reinforces the input at different levels of CNN to learn input-specific feature maps. Our empirical study shows that BiDIAF improves the power loss prediction accuracy by about 3% and localization accuracy by about 4%. Our end-to-end model yields further improvement of about 24% on localization when learned in a weakly supervised manner. Our approach is generalizable and showed promising results on web crawled solar panel images. Our system has a frame rate of 22 fps (including all steps) on a NVIDIA TitanX GPU. Additionally, we collected first of it's kind dataset for solar panel image analysis consisting 45,000+ images.

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

Removing objects from videos remains difficult in the presence of real-world imperfections such as shadows, abrupt motion, and defective masks. Existing diffusion-based video inpainting models often struggle to maintain temporal stability and visual consistency under these challenges. We propose Stable Video Object Removal (SVOR), a robust framework that achieves shadow-free, flicker-free, and mask-defect-tolerant removal through three key designs: (1) Mask Union for Stable Erasure (MUSE), a windowed union strategy applied during temporal mask downsampling to preserve all target regions observed within each window, effectively handling abrupt motion and reducing missed removals; (2) Denoising-Aware Segmentation (DA-Seg), a lightweight segmentation head on a decoupled side branch equipped with Denoising-Aware AdaLN and trained with mask degradation to provide an internal diffusion-aware localization prior without affecting content generation; and (3) Curriculum Two-Stage Training: where Stage I performs self-supervised pretraining on unpaired real-background videos with online random masks to learn realistic background and temporal priors, and Stage II refines on synthetic pairs using mask degradation and side-effect-weighted losses, jointly removing objects and their associated shadows/reflections while improving cross-domain robustness. Extensive experiments show that SVOR attains new state-of-the-art results across multiple datasets and degraded-mask benchmarks, advancing video object removal from ideal settings toward real-world applications.

Bug localization, which is used to help programmers identify the location of bugs in source code, is an essential task in software development. Researchers have already made efforts to harness the powerful deep learning (DL) techniques to automate it. However, training bug localization model is usually challenging because it requires a large quantity of data labeled with the bug's exact location, which is difficult and time-consuming to collect. By contrast, obtaining bug detection data with binary labels of whether there is a bug in the source code is much simpler. This paper proposes a WEakly supervised bug LocaLization (WELL) method, which only uses the bug detection data with binary labels to train a bug localization model. With CodeBERT finetuned on the buggy-or-not binary labeled data, WELL can address bug localization in a weakly supervised manner. The evaluations on three method-level synthetic datasets and one file-level real-world dataset show that WELL is significantly better than the existing SOTA model in typical bug localization tasks such as variable misuse and other programming bugs.

Software developers spend a significant portion of time fixing bugs in their projects. To streamline this process, bug localization approaches have been proposed to identify the source code files that are likely responsible for a particular bug. Prior work proposed several similarity-based machine-learning techniques for bug localization. Despite significant advances in these techniques, they do not directly optimize the evaluation measures. We argue that directly optimizing evaluation measures can positively contribute to the performance of bug localization approaches. Therefore, In this paper, we utilize Reinforcement Learning (RL) techniques to directly optimize the ranking metrics. We propose RLocator, a Reinforcement Learning-based bug localization approach. We formulate RLocator using a Markov Decision Process (MDP) to optimize the evaluation measures directly. We present the technique and experimentally evaluate it based on a benchmark dataset of 8,316 bug reports from six highly popular Apache projects. The results of our evaluation reveal that RLocator achieves a Mean Reciprocal Rank (MRR) of 0.62, a Mean Average Precision (MAP) of 0.59, and a Top 1 score of 0.46. We compare RLocator with two state-of-the-art bug localization tools, FLIM and BugLocator. Our evaluation reveals that RLocator outperforms both approaches by a substantial margin, with improvements of 38.3% in MAP, 36.73% in MRR, and 23.68% in the Top K metric. These findings highlight that directly optimizing evaluation measures considerably contributes to performance improvement of the bug localization problem.

Issue localization, the process of identifying code locations that need modification to resolve software issues, is a critical yet challenging task in software development. The semantic gap between natural language issue descriptions and faulty code requires complex multi-hop reasoning through code dependencies. Existing LLM-based agents attempt to address this by integrating repository retrieval tools. However, this transforms issue localization into a demanding task we call Repo Deep Search, which requires the LLM to effectively utilize various repository retrieval tools throughout a multi-step reasoning and navigation process. To tackle this challenge, we present ToolTrain, a two-stage tool-integrated training framework combining rejection-sampled supervised fine-tuning and tool-integrated reinforcement learning to enhance LLMs' ability to use retrieval tools for issue localization. Experimental results show that ToolTrain-trained models achieve state-of-the-art performance, with our 32B model even surpassing Claude-3.7 on function-level localization. The results also show that improved localization performance translates to better end-to-end issue resolution performance. This further demonstrates that training for issue localization is a viable and effective strategy for improving automated software development.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

With the growing interest on Large Language Models (LLMs) for fault localization and program repair, ensuring the integrity and generalizability of the LLM-based methods becomes paramount. The code in existing widely-adopted benchmarks for these tasks was written before the the bloom of LLMs and may be included in the training data of existing popular LLMs, thereby suffering from the threat of data leakage, leading to misleadingly optimistic performance metrics. To address this issue, we introduce "ConDefects", a novel dataset of real faults meticulously curated to eliminate such overlap. ConDefects contains 1,254 Java faulty programs and 1,625 Python faulty programs. All these programs are sourced from the online competition platform AtCoder and were produced between October 2021 and September 2023. We pair each fault with fault locations and the corresponding repaired code versions, making it tailored for in fault localization and program repair related research. We also provide interfaces for selecting subsets based on different time windows and coding task difficulties. While inspired by LLM-based tasks, ConDefects can be adopted for benchmarking ALL types of fault localization and program repair methods. The dataset is publicly available, and a demo video can be found at https://www.youtube.com/watch?v=22j15Hj5ONk.

The issue localization task aims to identify the locations in a software repository that requires modification given a natural language issue description. This task is fundamental yet challenging in automated software engineering due to the semantic gap between issue description and source code implementation. This gap manifests as two mismatches:(1) symptom-to-cause mismatches, where descriptions do not explicitly reveal underlying root causes; (2) one-to-many mismatches, where a single issue corresponds to multiple interdependent code entities. To address these two mismatches, we propose GraphLocator, an approach that mitigates symptom-to-cause mismatches through causal structure discovering and resolves one-to-many mismatches via dynamic issue disentangling. The key artifact is the causal issue graph (CIG), in which vertices represent discovered sub-issues along with their associated code entities, and edges encode the causal dependencies between them. The workflow of GraphLocator consists of two phases: symptom vertices locating and dynamic CIG discovering; it first identifies symptom locations on the repository graph, then dynamically expands the CIG by iteratively reasoning over neighboring vertices. Experiments on three real-world datasets demonstrates the effectiveness of GraphLocator: (1) Compared with baselines, GraphLocator achieves more accurate localization with average improvements of +19.49% in function-level recall and +11.89% in precision. (2) GraphLocator outperforms baselines on both symptom-to-cause and one-to-many mismatch scenarios, achieving recall improvement of +16.44% and +19.18%, precision improvement of +7.78% and +13.23%, respectively. (3) The CIG generated by GraphLocator yields the highest relative improvement, resulting in a 28.74% increase in performance on downstream resolving task.

Large language models (LLMs) have recently shown strong potential for Automated Program Repair (APR), yet most existing approaches remain unimodal and fail to leverage the rich diagnostic signals contained in visual artifacts such as screenshots and control-flow graphs. In practice, many bug reports convey critical information visually (e.g., layout breakage or missing widgets), but directly using such dense visual inputs often causes context loss and noise, making it difficult for MLLMs to ground visual observations into precise fault localization and executable patches. To bridge this semantic gap, we propose SVRepair, a multimodal APR framework with structured visual representation. SVRepair first fine-tunes a vision-language model, Structured Visual Representation (SVR), to uniformly transform heterogeneous visual artifacts into a semantic scene graph that captures GUI elements and their structural relations (e.g., hierarchy), providing normalized, code-relevant context for downstream repair. Building on the graph, SVRepair drives a coding agent to localize faults and synthesize patches, and further introduces an iterative visual-artifact segmentation strategy that progressively narrows the input to bug-centered regions to suppress irrelevant context and reduce hallucinations. Extensive experiments across multiple benchmarks demonstrate state-of-the-art performance: SVRepair achieves 36.47\% accuracy on SWE-Bench M, 38.02\% on MMCode, and 95.12\% on CodeVision, validating the effectiveness of SVRepair for multimodal program repair.

Large language models (LLMs) have shown impressive effectiveness in various software engineering tasks, including automated program repair (APR). In this study, we take a deep dive into automated bug fixing utilizing LLMs. In contrast to many deep learning-based APR methods that assume known bug locations, rely on line-level localization tools, or address bug prediction and fixing in one step, our approach uniquely employs LLMs to predict bug location at the token level and subsequently utilizes them for bug fixing. This methodological separation of bug localization and fixing using different LLMs enables effective integration of diverse contextual information and improved incorporation of inductive biases. We introduce Toggle: Token-Granulated Bug Localization and Repair, a comprehensive program repair framework that integrates a bug localization model, an adjustment unit, and a bug-fixing model. Toggle takes a buggy function as input and generates a complete corrected function. We investigate various styles of prompting to the bug fixing model to identify the most effective prompts that better utilize the inductive bias and significantly outperform others. Toggle achieves the new state-of-the-art (SOTA) performance on the CodeXGLUE code refinement benchmark, and exhibits better and comparable performance on several other widely-used APR datasets, including Defects4J.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Software issue localization, the task of identifying the precise code locations (files, classes, or functions) relevant to a natural language issue description (e.g., bug report, feature request), is a critical yet time-consuming aspect of software development. While recent LLM-based agentic approaches demonstrate promise, they often incur significant latency and cost due to complex multi-step reasoning and relying on closed-source LLMs. Alternatively, traditional code ranking models, typically optimized for query-to-code or code-to-code retrieval, struggle with the verbose and failure-descriptive nature of issue localization queries. To bridge this gap, we introduce SweRank, an efficient and effective retrieve-and-rerank framework for software issue localization. To facilitate training, we construct SweLoc, a large-scale dataset curated from public GitHub repositories, featuring real-world issue descriptions paired with corresponding code modifications. Empirical results on SWE-Bench-Lite and LocBench show that SweRank achieves state-of-the-art performance, outperforming both prior ranking models and costly agent-based systems using closed-source LLMs like Claude-3.5. Further, we demonstrate SweLoc's utility in enhancing various existing retriever and reranker models for issue localization, establishing the dataset as a valuable resource for the community.

Large language models (LLMs) and LLM-based Agents have been applied to fix bugs automatically, demonstrating the capability in addressing software defects by engaging in development environment interaction, iterative validation and code modification. However, systematic analysis of these agent and non-agent systems remain limited, particularly regarding performance variations among top-performing ones. In this paper, we examine seven proprietary and open-source systems on the SWE-bench Lite benchmark for automated bug fixing. We first assess each system's overall performance, noting instances solvable by all or none of these sytems, and explore why some instances are uniquely solved by specific system types. We also compare fault localization accuracy at file and line levels and evaluate bug reproduction capabilities, identifying instances solvable only through dynamic reproduction. Through analysis, we concluded that further optimization is needed in both the LLM itself and the design of Agentic flow to improve the effectiveness of the Agent in bug fixing.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

As modern microservice systems grow increasingly popular and complex-often consisting of hundreds or even thousands of fine-grained, interdependent components-they are becoming more susceptible to frequent and subtle failures. Ensuring system reliability therefore hinges on accurate and efficient failure localization. Traditional failure localization approaches based on small models lack the flexibility to adapt to diverse failure scenarios, while recent LLM-based methods suffer from two major limitations: they often rely on rigid invocation workflows that constrain the model's ability to dynamically explore optimal localization paths, and they require resource-intensive inference, making them cost-prohibitive for real-world deployment. To address these challenges, we explore the use of reinforcement fine-tuning to equip lightweight LLMs with reasoning and self-refinement capabilities, significantly improving the cost-effectiveness and adaptability of LLM-based failure localization. We begin with an empirical study to identify three key capabilities essential for accurate localization. Building on these insights, we propose a progressive multi-stage GRPO fine-tuning framework, which integrates a multi-factor failure localization grader and a recursion-of-thought actor module. The resulting model, ThinkFL, not only outperforms existing state-of-the-art LLMs and baseline methods in localization accuracy but also reduces end-to-end localization latency from minutes to seconds, demonstrating strong potential for real-world applications.

We consider the task of mapping pseudocode to long programs that are functionally correct. Given test cases as a mechanism to validate programs, we search over the space of possible translations of the pseudocode to find a program that passes the validation. However, without proper credit assignment to localize the sources of program failures, it is difficult to guide search toward more promising programs. We propose to perform credit assignment based on signals from compilation errors, which constitute 88.7% of program failures. Concretely, we treat the translation of each pseudocode line as a discrete portion of the program, and whenever a synthesized program fails to compile, an error localization method tries to identify the portion of the program responsible for the failure. We then focus search over alternative translations of the pseudocode for those portions. For evaluation, we collected the SPoC dataset (Search-based Pseudocode to Code) containing 18,356 programs with human-authored pseudocode and test cases. Under a budget of 100 program compilations, performing search improves the synthesis success rate over using the top-one translation of the pseudocode from 25.6% to 44.7%.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

Code localization--identifying precisely where in a codebase changes need to be made--is a fundamental yet challenging task in software maintenance. Existing approaches struggle to efficiently navigate complex codebases when identifying relevant code sections. The challenge lies in bridging natural language problem descriptions with the appropriate code elements, often requiring reasoning across hierarchical structures and multiple dependencies. We introduce LocAgent, a framework that addresses code localization through graph-based representation. By parsing codebases into directed heterogeneous graphs, LocAgent creates a lightweight representation that captures code structures (files, classes, functions) and their dependencies (imports, invocations, inheritance), enabling LLM agents to effectively search and locate relevant entities through powerful multi-hop reasoning. Experimental results on real-world benchmarks demonstrate that our approach significantly enhances accuracy in code localization. Notably, our method with the fine-tuned Qwen-2.5-Coder-Instruct-32B model achieves comparable results to SOTA proprietary models at greatly reduced cost (approximately 86% reduction), reaching up to 92.7% accuracy on file-level localization while improving downstream GitHub issue resolution success rates by 12% for multiple attempts (Pass@10). Our code is available at https://github.com/gersteinlab/LocAgent.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Accurate project localization (e.g., files and functions) for issue resolution is a critical first step in software maintenance. However, existing benchmarks for issue localization, such as SWE-Bench and LocBench, are limited. They focus predominantly on pull-request issues and code locations, ignoring other evidence and non-code files such as commits, comments, configurations, and documentation. To address this gap, we introduce MULocBench, a comprehensive dataset of 1,100 issues from 46 popular GitHub Python projects. Comparing with existing benchmarks, MULocBench offers greater diversity in issue types, root causes, location scopes, and file types, providing a more realistic testbed for evaluation. Using this benchmark, we assess the performance of state-of-the-art localization methods and five LLM-based prompting strategies. Our results reveal significant limitations in current techniques: even at the file level, performance metrics (Acc@5, F1) remain below 40%. This underscores the challenge of generalizing to realistic, multi-faceted issue resolution. To enable future research on project localization for issue resolution, we publicly release MULocBench at https://huggingface.co/datasets/somethingone/MULocBench.

Recent developments in Large Language Model (LLM) agents are revolutionizing Autonomous Software Engineering (ASE), enabling automated coding, problem fixes, and feature improvements. However, localization -- precisely identifying software problems by navigating to relevant code sections -- remains a significant challenge. Current approaches often yield suboptimal results due to a lack of effective integration between LLM agents and precise code search mechanisms. This paper introduces OrcaLoca, an LLM agent framework that improves accuracy for software issue localization by integrating priority-based scheduling for LLM-guided action, action decomposition with relevance scoring, and distance-aware context pruning. Experimental results demonstrate that OrcaLoca becomes the new open-source state-of-the-art (SOTA) in function match rate (65.33%) on SWE-bench Lite. It also improves the final resolved rate of an open-source framework by 6.33 percentage points through its patch generation integration.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

Large language models (LLMs) have significantly advanced autonomous software engineering, leading to a growing number of software engineering agents that assist developers in automatic program repair. Issue localization forms the basis for accurate patch generation. However, because of limitations caused by the context window length of LLMs, existing issue localization methods face challenges in balancing concise yet effective contexts and adequately comprehensive search spaces. In this paper, we introduce CoSIL, an LLM driven, simple yet powerful function level issue localization method without training or indexing. CoSIL reduces the search space through module call graphs, iteratively searches the function call graph to obtain relevant contexts, and uses context pruning to control the search direction and manage contexts effectively. Importantly, the call graph is dynamically constructed by the LLM during search, eliminating the need for pre-parsing. Experiment results demonstrate that CoSIL achieves a Top-1 localization success rate of 43 percent and 44.6 percent on SWE bench Lite and SWE bench Verified, respectively, using Qwen2.5 Coder 32B, outperforming existing methods by 8.6 to 98.2 percent. When CoSIL is applied to guide the patch generation stage, the resolved rate further improves by 9.3 to 31.5 percent.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Tremendous efforts have been devoted to automating software debugging, a time-consuming process involving fault localization and repair generation. Recently, Large Language Models (LLMs) have shown great potential in automated debugging. However, we identified three challenges posed to traditional and LLM-based debugging tools: 1) the upstream imperfection of fault localization affects the downstream repair, 2) the deficiency in handling complex logic errors, and 3) the ignorance of program contexts. In this context, we propose the first automated, unified debugging framework, FixAgent, via LLM agent synergy. FixAgent can perform end-to-end localization, repair, and analysis of bugs. Our insight is that LLMs can benefit from general software engineering principles recognized by human developers in debugging, such as rubber duck debugging, enabling a better understanding of program functionality and logic bugs. Hence, we create three designs inspired by rubber ducking to address these challenges. They are agent specialization and synergy, key variable tracking, and program context comprehension, which request LLMs to provide explicit explanations and force them to focus on crucial program logic information. Experiments on the widely used dataset QuixBugs show that FixAgent correctly fixes 79 out of 80 bugs, 9 of which have never been fixed. It also plausibly patches 1.9X more defects than the best-performing repair tool on CodeFlaws, even with no bug location information and fewer than 0.6% sampling times. On average, FixAgent increases about 20% plausible and correct fixes compared to its base model using different LLMs, showing the effectiveness of our designs. Moreover, the correctness rate of FixAgent reaches remarkably 97.26%, indicating that FixAgent can potentially overcome the overfitting issue of the existing approaches.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Repository-level bug localization-the task of identifying where code must be modified to fix a bug-is a critical software engineering challenge. Standard Large Language Modles (LLMs) are often unsuitable for this task due to context window limitations that prevent them from processing entire code repositories. As a result, various retrieval methods are commonly used, including keyword matching, text similarity, and simple graph-based heuristics such as Breadth-First Search. Graph Neural Networks (GNNs) offer a promising alternative due to their ability to model complex, repository-wide dependencies; however, their application has been hindered by the lack of a dedicated benchmark. To address this gap, we introduce GREPO, the first GNN benchmark for repository-scale bug localization tasks. GREPO comprises 86 Python repositories and 47294 bug-fixing tasks, providing graph-based data structures ready for direct GNN processing. Our evaluation of various GNN architectures shows outstanding performance compared to established information retrieval baselines. This work highlights the potential of GNNs for bug localization and established GREPO as a foundation resource for future research, The code is available at https://github.com/qingpingmo/GREPO.

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Modern Deep Learning (DL) architectures based on transformers (e.g., BERT, RoBERTa) are exhibiting performance improvements across a number of natural language tasks. While such DL models have shown tremendous potential for use in software engineering applications, they are often hampered by insufficient training data. Particularly constrained are applications that require project-specific data, such as bug localization, which aims at recommending code to fix a newly submitted bug report. Deep learning models for bug localization require a substantial training set of fixed bug reports, which are at a limited quantity even in popular and actively developed software projects. In this paper, we examine the effect of using synthetic training data on transformer-based DL models that perform a more complex variant of bug localization, which has the goal of retrieving bug-inducing changesets for each bug report. To generate high-quality synthetic data, we propose novel data augmentation operators that act on different constituent components of bug reports. We also describe a data balancing strategy that aims to create a corpus of augmented bug reports that better reflects the entire source code base, because existing bug reports used as training data usually reference a small part of the code base.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Correcting bugs using modern Automated Program Repair (APR) can be both time-consuming and resource-expensive. We describe a program repair approach that aims to improve the scalability of modern APR tools. The approach leverages program reduction in the form of program slicing to eliminate code irrelevant to fixing the bug, which improves the APR tool's overall performance. We investigate slicing's impact on all three phases of the repair process: fault localization, patch generation, and patch validation. Our empirical exploration finds that the proposed approach, on average, enhances the repair ability of the TBar APR tool, but we also discovered a few cases where it was less successful. Specifically, on examples from the widely used Defects4J dataset, we obtain a substantial reduction in median repair time, which falls from 80 minutes to just under 18 minutes. We conclude that program reduction can improve the performance of APR without degrading repair quality, but this improvement is not universal. A replication package is available via Zenodo at https://doi.org/10.5281/zenodo.13074333. Keywords: automated program repair, dynamic program slicing, fault localization, test-suite reduction, hybrid techniques.

As machine learning tools progress, the inevitable question arises: How can machine learning help us write better code? With significant progress being achieved in natural language processing with models like GPT-3 and Bert, the applications of natural language processing techniques to code are starting to be explored. Most of the research has been focused on automatic program repair (APR), and while the results on synthetic or highly filtered datasets are promising, such models are hard to apply in real-world scenarios because of inadequate bug localization. We propose BigIssue: a benchmark for realistic bug localization. The goal of the benchmark is two-fold. We provide (1) a general benchmark with a diversity of real and synthetic Java bugs and (2) a motivation to improve bug localization capabilities of models through attention to the full repository context. With the introduction of BigIssue, we hope to advance the state of the art in bug localization, in turn improving APR performance and increasing its applicability to the modern development cycle.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

Unlike code completion, debugging requires localizing faults and applying targeted edits. We observe that frontier LLMs often regenerate correct but over-edited solutions during debugging. To evaluate how far LLMs are from precise debugging, we introduce the Precise Debugging Benchmark (PDB) framework, which automatically converts any coding dataset into a debugging benchmark with precision-aware evaluation. PDB generates buggy programs by synthesizing verified atomic bugs and composing them into multi-bug programs. We define two novel metrics, edit-level precision and bug-level recall, which measures how many necessary edits are made and how many bugs are resolved. We release two evaluation benchmarks: PDB-Single-Hard on single-line bugs, and PDB-Multi on multi-line bugs. Experiments show that frontier models, such as GPT-5.1-Codex and DeepSeek-V3.2-Thinking, achieve unit-test pass rates above 76% but exhibit precision below 45%, even when explicitly instructed to perform minimal debugging. Finally, we show that iterative and agentic debugging strategies do not substantially improve precision or recall, highlighting the need to rethink post-training pipelines for coding models.

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Point defects play a central role in driving the properties of materials. First-principles methods are widely used to compute defect energetics and structures, including at scale for high-throughput defect databases. However, these methods are computationally expensive, making machine-learning force fields (MLFFs) an attractive alternative for accelerating structural relaxations. Most existing MLFFs are based on graph neural networks (GNNs), which can suffer from oversmoothing and poor representation of long-range interactions. Both of these issues are especially of concern when modeling point defects. To address these challenges, we introduce the Accelerated Deep Atomic Potential Transformer (ADAPT), an MLFF that replaces graph representations with a direct coordinates-in-space formulation and explicitly considers all pairwise atomic interactions. Atoms are treated as tokens, with a Transformer encoder modeling their interactions. Applied to a dataset of silicon point defects, ADAPT achieves a roughly 33 percent reduction in both force and energy prediction errors relative to a state-of-the-art GNN-based model, while requiring only a fraction of the computational cost.

Anomaly inspection plays a vital role in industrial manufacturing, but the scarcity of anomaly samples significantly limits the effectiveness of existing methods in tasks such as localization and classification. While several anomaly synthesis approaches have been introduced for data augmentation, they often struggle with low realism, inaccurate mask alignment, and poor generalization. To overcome these limitations, we propose Generate Aligned Anomaly (GAA), a region-guided, few-shot anomaly image-mask pair generation framework. GAA leverages the strong priors of a pretrained latent diffusion model to generate realistic, diverse, and semantically aligned anomalies using only a small number of samples. The framework first employs Localized Concept Decomposition to jointly model the semantic features and spatial information of anomalies, enabling flexible control over the type and location of anomalies. It then utilizes Adaptive Multi-Round Anomaly Clustering to perform fine-grained semantic clustering of anomaly concepts, thereby enhancing the consistency of anomaly representations. Subsequently, a region-guided mask generation strategy ensures precise alignment between anomalies and their corresponding masks, while a low-quality sample filtering module is introduced to further improve the overall quality of the generated samples. Extensive experiments on the MVTec AD and LOCO datasets demonstrate that GAA achieves superior performance in both anomaly synthesis quality and downstream tasks such as localization and classification.

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

Recently, multiple Automated Program Repair (APR) techniques based on Large Language Models (LLMs) have been proposed to enhance the repair performance. While these techniques mainly focus on the single-line or hunk-level repair, they face significant challenges in real-world application due to the limited repair task scope and costly statement-level fault localization. However, the more practical function-level APR, which broadens the scope of APR task to fix entire buggy functions and requires only cost-efficient function-level fault localization, remains underexplored. In this paper, we conduct the first comprehensive study of LLM-based function-level APR including investigating the effect of the few-shot learning mechanism and the auxiliary repair-relevant information. Specifically, we adopt six widely-studied LLMs and construct a benchmark in both the Defects4J 1.2 and 2.0 datasets. Our study demonstrates that LLMs with zero-shot learning are already powerful function-level APR techniques, while applying the few-shot learning mechanism leads to disparate repair performance. Moreover, we find that directly applying the auxiliary repair-relevant information to LLMs significantly increases function-level repair performance. Inspired by our findings, we propose an LLM-based function-level APR technique, namely SRepair, which adopts a dual-LLM framework to leverage the power of the auxiliary repair-relevant information for advancing the repair performance. The evaluation results demonstrate that SRepair can correctly fix 300 single-function bugs in the Defects4J dataset, largely surpassing all previous APR techniques by at least 85%, without the need for the costly statement-level fault location information. Furthermore, SRepair successfully fixes 32 multi-function bugs in the Defects4J dataset, which is the first time achieved by any APR technique ever to our best knowledge.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method that can generate high-resolution segmentation masks. It can also be flexibly integrated into common instance segmentation meta-architecture such as Mask-RCNN and semantic meta-architecture such as FCN. We implemented a model, termed as SEMI-PointRend, to generate precise segmentation masks by applying the PointRend neural network module. In this paper, we focus on comparing the defect segmentation predictions of SEMI-PointRend and Mask-RCNN for various defect types (line-collapse, single bridge, thin bridge, multi bridge non-horizontal). We show that SEMI-PointRend can outperforms Mask R-CNN by up to 18.8% in terms of segmentation mean average precision.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

Researchers have made significant progress in automating the software development process in the past decades. Recent progress in Large Language Models (LLMs) has significantly impacted the development process, where developers can use LLM-based programming assistants to achieve automated coding. Nevertheless, software engineering involves the process of program improvement apart from coding, specifically to enable software maintenance (e.g. bug fixing) and software evolution (e.g. feature additions). In this paper, we propose an automated approach for solving GitHub issues to autonomously achieve program improvement. In our approach called AutoCodeRover, LLMs are combined with sophisticated code search capabilities, ultimately leading to a program modification or patch. In contrast to recent LLM agent approaches from AI researchers and practitioners, our outlook is more software engineering oriented. We work on a program representation (abstract syntax tree) as opposed to viewing a software project as a mere collection of files. Our code search exploits the program structure in the form of classes/methods to enhance LLM's understanding of the issue's root cause, and effectively retrieve a context via iterative search. The use of spectrum-based fault localization using tests, further sharpens the context, as long as a test-suite is available. Experiments on SWE-bench-lite (300 real-life GitHub issues) show increased efficacy in solving GitHub issues (19% on SWE-bench-lite), which is higher than the efficacy of the recently reported SWE-agent. In addition, AutoCodeRover achieved this efficacy with significantly lower cost (on average, $0.43 USD), compared to other baselines. We posit that our workflow enables autonomous software engineering, where, in future, auto-generated code from LLMs can be autonomously improved.

Text-to-image models give rise to workflows which often begin with an exploration step, where users sift through a large collection of generated images. The global nature of the text-to-image generation process prevents users from narrowing their exploration to a particular object in the image. In this paper, we present a technique to generate a collection of images that depicts variations in the shape of a specific object, enabling an object-level shape exploration process. Creating plausible variations is challenging as it requires control over the shape of the generated object while respecting its semantics. A particular challenge when generating object variations is accurately localizing the manipulation applied over the object's shape. We introduce a prompt-mixing technique that switches between prompts along the denoising process to attain a variety of shape choices. To localize the image-space operation, we present two techniques that use the self-attention layers in conjunction with the cross-attention layers. Moreover, we show that these localization techniques are general and effective beyond the scope of generating object variations. Extensive results and comparisons demonstrate the effectiveness of our method in generating object variations, and the competence of our localization techniques.

Visual localization is the task of estimating a 6-DoF camera pose of a query image within a provided 3D reference map. Thanks to recent advances in various 3D sensors, 3D point clouds are becoming a more accurate and affordable option for building the reference map, but research to match the points of 3D point clouds with pixels in 2D images for visual localization remains challenging. Existing approaches that jointly learn 2D-3D feature matching suffer from low inliers due to representational differences between the two modalities, and the methods that bypass this problem into classification have an issue of poor refinement. In this work, we propose EP2P-Loc, a novel large-scale visual localization method that mitigates such appearance discrepancy and enables end-to-end training for pose estimation. To increase the number of inliers, we propose a simple algorithm to remove invisible 3D points in the image, and find all 2D-3D correspondences without keypoint detection. To reduce memory usage and search complexity, we take a coarse-to-fine approach where we extract patch-level features from 2D images, then perform 2D patch classification on each 3D point, and obtain the exact corresponding 2D pixel coordinates through positional encoding. Finally, for the first time in this task, we employ a differentiable PnP for end-to-end training. In the experiments on newly curated large-scale indoor and outdoor benchmarks based on 2D-3D-S and KITTI, we show that our method achieves the state-of-the-art performance compared to existing visual localization and image-to-point cloud registration methods.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Large language models (LLMs) exhibit strong performance on self-contained programming tasks. However, they still struggle with repository-level software engineering (SWE), which demands (1) deep codebase navigation with effective context management for accurate localization, and (2) systematic approaches for iterative, test-driven code modification to resolve issues. To address these challenges, we propose SWE-Adept, an LLM-based two-agent framework where a localization agent identifies issue-relevant code locations and a resolution agent implements the corresponding fixes. For issue localization, we introduce agent-directed depth-first search that selectively traverses code dependencies. This minimizes issue-irrelevant content in the agent's context window and improves localization accuracy. For issue resolution, we employ adaptive planning and structured problem solving. We equip the agent with specialized tools for progress tracking and Git-based version control. These tools interface with a shared working memory that stores code-state checkpoints indexed by execution steps, facilitating precise checkpoint retrieval. This design enables reliable agent-driven version-control operations for systematic issue resolution, including branching to explore alternative solutions and reverting failed edits. Experiments on SWE-Bench Lite and SWE-Bench Pro demonstrate that SWE-Adept consistently outperforms prior approaches in both issue localization and resolution, improving the end-to-end resolve rate by up to 4.7%.

Localizing the exact pathological regions in a given medical scan is an important imaging problem that traditionally requires a large amount of bounding box ground truth annotations to be accurately solved. However, there exist alternative, potentially weaker, forms of supervision, such as accompanying free-text reports, which are readily available. The task of performing localization with textual guidance is commonly referred to as phrase grounding. In this work, we use a publicly available Foundation Model, namely the Latent Diffusion Model, to perform this challenging task. This choice is supported by the fact that the Latent Diffusion Model, despite being generative in nature, contains cross-attention mechanisms that implicitly align visual and textual features, thus leading to intermediate representations that are suitable for the task at hand. In addition, we aim to perform this task in a zero-shot manner, i.e., without any training on the target task, meaning that the model's weights remain frozen. To this end, we devise strategies to select features and also refine them via post-processing without extra learnable parameters. We compare our proposed method with state-of-the-art approaches which explicitly enforce image-text alignment in a joint embedding space via contrastive learning. Results on a popular chest X-ray benchmark indicate that our method is competitive with SOTA on different types of pathology, and even outperforms them on average in terms of two metrics (mean IoU and AUC-ROC). Source code will be released upon acceptance at https://github.com/vios-s.

Denoising diffusion models have enabled high-quality image generation and editing. We present a method to localize the desired edit region implicit in a text instruction. We leverage InstructPix2Pix (IP2P) and identify the discrepancy between IP2P predictions with and without the instruction. This discrepancy is referred to as the relevance map. The relevance map conveys the importance of changing each pixel to achieve the edits, and is used to to guide the modifications. This guidance ensures that the irrelevant pixels remain unchanged. Relevance maps are further used to enhance the quality of text-guided editing of 3D scenes in the form of neural radiance fields. A field is trained on relevance maps of training views, denoted as the relevance field, defining the 3D region within which modifications should be made. We perform iterative updates on the training views guided by rendered relevance maps from the relevance field. Our method achieves state-of-the-art performance on both image and NeRF editing tasks. Project page: https://ashmrz.github.io/WatchYourSteps/

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

Most programmers make mistakes when writing code. Some of these mistakes are small and require few edits to the original program -- a class of errors recently termed last mile mistakes. These errors break the flow for experienced developers and can stump novice programmers. Existing automated repair techniques targeting this class of errors are language-specific and do not easily carry over to new languages. Transferring symbolic approaches requires substantial engineering and neural approaches require data and retraining. We introduce RING, a multilingual repair engine powered by a large language model trained on code (LLMC) such as Codex. Such a multilingual engine enables a flipped model for programming assistance, one where the programmer writes code and the AI assistance suggests fixes, compared to traditional code suggestion technology. Taking inspiration from the way programmers manually fix bugs, we show that a prompt-based strategy that conceptualizes repair as localization, transformation, and candidate ranking, can successfully repair programs in multiple languages with minimal effort. We present the first results for such a multilingual repair engine by evaluating on 6 different languages and comparing performance to language-specific repair engines. We show that RING can outperform language-specific repair engines for three of these languages.

Precise localization of GUI elements is crucial for the development of GUI agents. Traditional methods rely on bounding box or center-point regression, neglecting spatial interaction uncertainty and visual-semantic hierarchies. Recent methods incorporate attention mechanisms but still face two key issues: (1) ignoring processing background regions causes attention drift from the desired area, and (2) uniform modeling the target UI element fails to distinguish between its center and edges, leading to click imprecision. Inspired by how humans visually process and interact with GUI elements, we propose the Valley-to-Peak (V2P) method to address these issues. To mitigate background distractions, V2P introduces a suppression attention mechanism that minimizes the model's focus on irrelevant regions to highlight the intended region. For the issue of center-edge distinction, V2P applies a Fitts' Law-inspired approach by modeling GUI interactions as 2D Gaussian heatmaps where the weight gradually decreases from the center towards the edges. The weight distribution follows a Gaussian function, with the variance determined by the target's size. Consequently, V2P effectively isolates the target area and teaches the model to concentrate on the most essential point of the UI element. The model trained by V2P achieves the performance with 92.4\% and 52.5\% on two benchmarks ScreenSpot-v2 and ScreenSpot-Pro (see Fig.~fig:main_results_charts). Ablations further confirm each component's contribution, underscoring V2P's generalizability in precise GUI grounding tasks and its potential for real-world deployment in future GUI agents.

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

We present a deep learning approach for quantifying and localizing ex-situ porosity within Laser Powder Bed Fusion fabricated samples utilizing in-situ thermal image monitoring data. Our goal is to build the real time porosity map of parts based on thermal images acquired during the build. The quantification task builds upon the established Convolutional Neural Network model architecture to predict pore count and the localization task leverages the spatial and temporal attention mechanisms of the novel Video Vision Transformer model to indicate areas of expected porosity. Our model for porosity quantification achieved a R^2 score of 0.57 and our model for porosity localization produced an average IoU score of 0.32 and a maximum of 1.0. This work is setting the foundations of part porosity "Digital Twins" based on additive manufacturing monitoring data and can be applied downstream to reduce time-intensive post-inspection and testing activities during part qualification and certification. In addition, we seek to accelerate the acquisition of crucial insights normally only available through ex-situ part evaluation by means of machine learning analysis of in-situ process monitoring data.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Power batteries are essential components in electric vehicles, where internal structural defects can pose serious safety risks. We conduct a comprehensive study on a new task, power battery detection (PBD), which aims to localize the dense endpoints of cathode and anode plates from industrial X-ray images for quality inspection. Manual inspection is inefficient and error-prone, while traditional vision algorithms struggle with densely packed plates, low contrast, scale variation, and imaging artifacts. To address this issue and drive more attention into this meaningful task, we present PBD5K, the first large-scale benchmark for this task, consisting of 5,000 X-ray images from nine battery types with fine-grained annotations and eight types of real-world visual interference. To support scalable and consistent labeling, we develop an intelligent annotation pipeline that combines image filtering, model-assisted pre-labeling, cross-verification, and layered quality evaluation. We formulate PBD as a point-level segmentation problem and propose MDCNeXt, a model designed to extract and integrate multi-dimensional structure clues including point, line, and count information from the plate itself. To improve discrimination between plates and suppress visual interference, MDCNeXt incorporates two state space modules. The first is a prompt-filtered module that learns contrastive relationships guided by task-specific prompts. The second is a density-aware reordering module that refines segmentation in regions with high plate density. In addition, we propose a distance-adaptive mask generation strategy to provide robust supervision under varying spatial distributions of anode and cathode positions. The source code and datasets will be publicly available at https://github.com/Xiaoqi-Zhao-DLUT/X-ray-PBD{PBD5K}.

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in realworld manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions. Our approach leverages parallel memory banks that capture the distinct statistical properties of both normality and anomalous patterns, addressing the fundamental flaw of uniform outlier assumptions. To overcome data scarcity, we employ latent diffusion models with domain-specific textual conditioning, generating in-distribution synthetic defects that preserve industrial context. Our neighborhood-aware ratio scoring mechanism elegantly fuses complementary distance metrics, amplifying signals in regions exhibiting both deviation from normality and similarity to known defect patterns. Experimental validation on KSDD2 demonstrates superior performance (94.2% I-AUROC, 97.7% P-AUROC), with optimal augmentation at 100 synthetic samples.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Code contains security and functional bugs. The process of identifying and localizing them is difficult and relies on human labor. In this work, we present a novel approach (FLAG) to assist human debuggers. FLAG is based on the lexical capabilities of generative AI, specifically, Large Language Models (LLMs). Here, we input a code file then extract and regenerate each line within that file for self-comparison. By comparing the original code with an LLM-generated alternative, we can flag notable differences as anomalies for further inspection, with features such as distance from comments and LLM confidence also aiding this classification. This reduces the inspection search space for the designer. Unlike other automated approaches in this area, FLAG is language-agnostic, can work on incomplete (and even non-compiling) code and requires no creation of security properties, functional tests or definition of rules. In this work, we explore the features that help LLMs in this classification and evaluate the performance of FLAG on known bugs. We use 121 benchmarks across C, Python and Verilog; with each benchmark containing a known security or functional weakness. We conduct the experiments using two state of the art LLMs in OpenAI's code-davinci-002 and gpt-3.5-turbo, but our approach may be used by other models. FLAG can identify 101 of the defects and helps reduce the search space to 12-17% of source code.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

The presence of point defects such as vacancies plays an important role in material design. Here, we demonstrate that a graph neural network (GNN) model trained only on perfect materials can also be used to predict vacancy formation energies (E_{vac}) of defect structures without the need for additional training data. Such GNN-based predictions are considerably faster than density functional theory (DFT) calculations with reasonable accuracy and show the potential that GNNs are able to capture a functional form for energy predictions. To test this strategy, we developed a DFT dataset of 508 E_{vac} consisting of 3D elemental solids, alloys, oxides, nitrides, and 2D monolayer materials. We analyzed and discussed the applicability of such direct and fast predictions. We applied the model to predict 192494 E_{vac} for 55723 materials in the JARVIS-DFT database.

Addressing the uncertainty and variability in the quality of 3D printed metals can further the wide spread use of this technology. Process mapping for new alloys is crucial for determining optimal process parameters that consistently produce acceptable printing quality. Process mapping is typically performed by conventional methods and is used for the design of experiments and ex situ characterization of printed parts. On the other hand, in situ approaches are limited because their observable features are limited and they require complex high-cost setups to obtain temperature measurements to boost accuracy. Our method relaxes these limitations by incorporating the temporal features of molten metal dynamics during laser-metal interactions using video vision transformers and high-speed imaging. Our approach can be used in existing commercial machines and can provide in situ process maps for efficient defect and variability quantification. The generalizability of the approach is demonstrated by performing cross-dataset evaluations on alloys with different compositions and intrinsic thermofluid properties.

Zero-shot anomaly detection (ZSAD) methods entail detecting anomalies directly without access to any known normal or abnormal samples within the target item categories. Existing approaches typically rely on the robust generalization capabilities of multimodal pretrained models, computing similarities between manually crafted textual features representing "normal" or "abnormal" semantics and image features to detect anomalies and localize anomalous patches. However, the generic descriptions of "abnormal" often fail to precisely match diverse types of anomalies across different object categories. Additionally, computing feature similarities for single patches struggles to pinpoint specific locations of anomalies with various sizes and scales. To address these issues, we propose a novel ZSAD method called FiLo, comprising two components: adaptively learned Fine-Grained Description (FG-Des) and position-enhanced High-Quality Localization (HQ-Loc). FG-Des introduces fine-grained anomaly descriptions for each category using Large Language Models (LLMs) and employs adaptively learned textual templates to enhance the accuracy and interpretability of anomaly detection. HQ-Loc, utilizing Grounding DINO for preliminary localization, position-enhanced text prompts, and Multi-scale Multi-shape Cross-modal Interaction (MMCI) module, facilitates more accurate localization of anomalies of different sizes and shapes. Experimental results on datasets like MVTec and VisA demonstrate that FiLo significantly improves the performance of ZSAD in both detection and localization, achieving state-of-the-art performance with an image-level AUC of 83.9% and a pixel-level AUC of 95.9% on the VisA dataset. Code is available at https://github.com/CASIA-IVA-Lab/FiLo.

Modern reconstruction techniques can effectively model complex 3D scenes from sparse 2D views. However, automatically assessing the quality of novel views and identifying artifacts is challenging due to the lack of ground truth images and the limitations of no-reference image metrics in predicting detailed artifact maps. The absence of such quality metrics hinders accurate predictions of the quality of generated views and limits the adoption of post-processing techniques, such as inpainting, to enhance reconstruction quality. In this work, we propose a new no-reference metric, Puzzle Similarity, which is designed to localize artifacts in novel views. Our approach utilizes image patch statistics from the input views to establish a scene-specific distribution that is later used to identify poorly reconstructed regions in the novel views. We test and evaluate our method in the context of 3D reconstruction; to this end, we collected a novel dataset of human quality assessment in unseen reconstructed views. Through this dataset, we demonstrate that our method can not only successfully localize artifacts in novel views, correlating with human assessment, but do so without direct references. Surprisingly, our metric outperforms both no-reference metrics and popular full-reference image metrics. We can leverage our new metric to enhance applications like automatic image restoration, guided acquisition, or 3D reconstruction from sparse inputs.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

Deep learning and language models are increasingly dominating automated program repair research. While previous generate-and-validate approaches were able to find and use fix ingredients on a file or even project level, neural language models are limited to the code that fits their input window. In this work we investigate how important identifier ingredients are in neural program repair and present ScanFix, an approach that leverages an additional scanner model to extract identifiers from a bug's file and potentially project-level context. We find that lack of knowledge of far-away identifiers is an important cause of failed repairs. Augmenting repair model input with scanner-extracted identifiers yields relative improvements of up to 31%. However, ScanFix is outperformed by a model with a large input window (> 5k tokens). When passing ingredients from the ground-truth fix, improvements are even higher. This shows that, with refined extraction techniques, ingredient scanning, similar to fix candidate ranking, could have the potential to become an important subtask of future automated repair systems. At the same time, it also demonstrates that this idea is subject to Sutton's bitter lesson and may be rendered unnecessary by new code models with ever-increasing context windows.

We present the first text-based image editing approach for object parts based on pre-trained diffusion models. Diffusion-based image editing approaches capitalized on the deep understanding of diffusion models of image semantics to perform a variety of edits. However, existing diffusion models lack sufficient understanding of many object parts, hindering fine-grained edits requested by users. To address this, we propose to expand the knowledge of pre-trained diffusion models to allow them to understand various object parts, enabling them to perform fine-grained edits. We achieve this by learning special textual tokens that correspond to different object parts through an efficient token optimization process. These tokens are optimized to produce reliable localization masks at each inference step to localize the editing region. Leveraging these masks, we design feature-blending and adaptive thresholding strategies to execute the edits seamlessly. To evaluate our approach, we establish a benchmark and an evaluation protocol for part editing. Experiments show that our approach outperforms existing editing methods on all metrics and is preferred by users 77-90% of the time in conducted user studies.

A prerequisite for coding agents to perform tasks on large repositories is code localization - the identification of relevant files, classes, and functions to work on. While repository-level code localization has been performed using embedding-based retrieval approaches such as vector search, recent work has focused on developing agents to localize relevant code either as a standalone precursor to or interleaved with performing actual work. Most prior methods on agentic code search equip the agent with complex, specialized tools, such as repository graphs derived from static analysis. In this paper, we demonstrate that, with an effective reinforcement learning recipe, a coding agent equipped with nothing more than a standard Unix terminal can be trained to achieve strong results. Our experiments on three benchmarks (SWE-Bench Verified, Pro, and Lite) reveal that our models consistently achieve superior or competitive performance over 2-18x larger base and post-trained LLMs and sometimes approach performance provided by closed models like Claude Sonnet, even when using specialized scaffolds. Our work particularly focuses on techniques for re-purposing existing coding agent environments for code search, reward design, and RL optimization. We release the resulting model family, CodeScout, along with all our code and data for the community to build upon.

Inspection systems utilizing unmanned aerial vehicles (UAVs) equipped with thermal cameras are increasingly popular for the maintenance of photovoltaic (PV) power plants. However, automation of the inspection task is a challenging problem as it requires precise navigation to capture images from optimal distances and viewing angles. This paper presents a novel localization pipeline that directly integrates PV module detection with UAV navigation, allowing precise positioning during inspection. The detections are used to identify the power plant structures in the image. These are associated with the power plant model and used to infer the UAV position relative to the inspected PV installation. We define visually recognizable anchor points for the initial association and use object tracking to discern global associations. Additionally, we present three different methods for visual segmentation of PV modules and evaluate their performance in relation to the proposed localization pipeline. The presented methods were verified and evaluated using custom aerial inspection data sets, demonstrating their robustness and applicability for real-time navigation. Additionally, we evaluate the influence of the power plant model precision on the localization methods.

Text-to-image generation from large generative models like Stable Diffusion, DALLE-2, etc., have become a common base for various tasks due to their superior quality and extensive knowledge bases. As image composition and generation are creative processes the artists need control over various parts of the images being generated. We find that just adding details about parts in the base text prompt either leads to an entirely different image (e.g., missing/incorrect identity) or the extra part details simply being ignored. To mitigate these issues, we introduce PartCraft, which enables image generation based on fine-grained part-level details specified for objects in the base text prompt. This allows more control for artists and enables novel object compositions by combining distinctive object parts. PartCraft first localizes object parts by denoising the object region from a specific diffusion process. This enables each part token to be localized to the right object region. After obtaining part masks, we run a localized diffusion process in each of the part regions based on fine-grained part descriptions and combine them to produce the final image. All the stages of PartCraft are based on repurposing a pre-trained diffusion model, which enables it to generalize across various domains without training. We demonstrate the effectiveness of part-level control provided by PartCraft qualitatively through visual examples and quantitatively in comparison to the contemporary baselines.

Bug localization in multi-repository microservice architectures is challenging due to the semantic gap between natural language bug reports and code, LLM context limitations, and the need to first identify the correct repository. We propose reframing this as a natural language reasoning task by transforming codebases into hierarchical NL summaries and performing NL-to-NL search instead of cross-modal retrieval. Our approach builds context-aware summaries at file, directory, and repository levels, then uses a two-phase search: first routing bug reports to relevant repositories, then performing top-down localization within those repositories. Evaluated on DNext, an industrial system with 46 repositories and 1.1M lines of code, our method achieves Pass@10 of 0.82 and MRR of 0.50, significantly outperforming retrieval baselines and agentic RAG systems like GitHub Copilot and Cursor. This work demonstrates that engineered natural language representations can be more effective than raw source code for scalable bug localization, providing an interpretable repository -> directory -> file search path, which is vital for building trust in enterprise AI tools by providing essential transparency.

Visual anomaly detection has been widely used in industrial inspection and medical diagnosis. Existing methods typically demand substantial training samples, limiting their utility in zero-/few-shot scenarios. While recent efforts have leveraged CLIP's zero-shot recognition capability for this task, they often ignore optimizing visual features to focus on local anomalies, reducing their efficacy. In this work, we propose AF-CLIP (Anomaly-Focused CLIP) by dramatically enhancing its visual representations to focus on local defects. Our approach introduces a lightweight adapter that emphasizes anomaly-relevant patterns in visual features, simultaneously optimizing both class-level features for image classification and patch-level features for precise localization. To capture anomalies of different sizes and improve detection accuracy, prior to the adapter, we develop a multi-scale spatial aggregation mechanism to effectively consolidate neighborhood context. Complementing these visual enhancements, we design learnable textual prompts that generically characterize normal and abnormal states. After optimization on auxiliary datasets using a composite objective function, AF-CLIP demonstrates strong zero-shot detection capability. Our method is also extended to few-shot scenarios by extra memory banks. Experimental results across diverse industrial and medical datasets demonstrate the effectiveness and generalization of our proposed method. Code is available at https://github.com/Faustinaqq/AF-CLIP.

Industry 4.0 has revolutionized manufacturing by driving digitalization and shifting the paradigm toward additive manufacturing (AM). Fused Deposition Modeling (FDM), a key AM technology, enables the creation of highly customized, cost-effective products with minimal material waste through layer-by-layer extrusion, posing a significant challenge to traditional subtractive methods. However, the susceptibility of material extrusion techniques to errors often requires expert intervention to detect and mitigate defects that can severely compromise product quality. While automated error detection and machine learning models exist, their generalizability across diverse 3D printer setups, firmware, and sensors is limited, and deep learning methods require extensive labeled datasets, hindering scalability and adaptability. To address these challenges, we present a process monitoring and control framework that leverages pre-trained Large Language Models (LLMs) alongside 3D printers to detect and address printing defects. The LLM evaluates print quality by analyzing images captured after each layer or print segment, identifying failure modes and querying the printer for relevant parameters. It then generates and executes a corrective action plan. We validated the effectiveness of the proposed framework in identifying defects by comparing it against a control group of engineers with diverse AM expertise. Our evaluation demonstrated that LLM-based agents not only accurately identify common 3D printing errors, such as inconsistent extrusion, stringing, warping, and layer adhesion, but also effectively determine the parameters causing these failures and autonomously correct them without any need for human intervention.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

The deployment of automated pavement defect detection is often hindered by poor cross-domain generalization. Supervised detectors achieve strong in-domain accuracy but require costly re-annotation for new environments, while standard self-supervised methods capture generic features and remain vulnerable to domain shift. We propose \ours, a self-supervised framework that visually probes target domains without labels. \ours introduces a Self-supervised Prompt Enhancement Module (SPEM), which derives defect-aware prompts from unlabeled target data to guide a frozen ViT backbone, and a Domain-Aware Prompt Alignment (DAPA) objective, which aligns prompt-conditioned source and target representations. Experiments on four challenging benchmarks show that \ours consistently outperforms strong supervised, self-supervised, and adaptation baselines, achieving robust zero-shot transfer, improved resilience to domain variations, and high data efficiency in few-shot adaptation. These results highlight self-supervised prompting as a practical direction for building scalable and adaptive visual inspection systems. Source code is publicly available: https://github.com/xixiaouab/PROBE/tree/main

Precise localization of GUI elements is crucial for the development of GUI agents. Traditional methods rely on bounding box or center-point regression, neglecting spatial interaction uncertainty and visual-semantic hierarchies. Recent methods incorporate attention mechanisms but still face two key issues: (1) ignoring processing background regions causes attention drift from the desired area, and (2) uniform labeling fails to distinguish between center and edges of the target UI element, leading to click imprecision. Inspired by how humans visually process and interact with GUI elements, we propose the Valley-to-Peak (V2P) method to address these issues. To mitigate background distractions, V2P introduces a suppression attention mechanism that minimizes the model's focus on irrelevant regions to highlight the intended region. For the issue of center-edge distinction, V2P applies a Fitts' Law-inspired approach by modeling GUI interactions as 2D Gaussian heatmaps where the weight gradually decreases from the center towards the edges. The weight distribution follows a Gaussian function, with the variance determined by the target's size. Consequently, V2P effectively isolates the target area and teaches the model to concentrate on the most essential point of the UI element. The model trained by V2P achieves the performance with 92.3% and 50.5% on two benchmarks ScreenSpot-v2 and ScreenSpot-Pro. Ablations further confirm each component's contribution, highlighting V2P's generalizability for precise GUI grounding tasks.

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

AI agents often fail in ways that are difficult to localize because executions are probabilistic, long-horizon, multi-agent, and mediated by noisy tool outputs. We address this gap by manually annotating failed agent runs and release a novel benchmark of 115 failed trajectories spanning structured API workflows, incident management, and open-ended web/file tasks. Each trajectory is annotated with a critical failure step and a category from a grounded-theory derived, cross-domain failure taxonomy. To mitigate the human cost of failure attribution, we present AGENTRX, an automated domain-agnostic diagnostic framework that pinpoints the critical failure step in a failed agent trajectory. It synthesizes constraints, evaluates them step-by-step, and produces an auditable validation log of constraint violations with associated evidence; an LLM-based judge uses this log to localize the critical step and category. Our framework improves step localization and failure attribution over existing baselines across three domains.

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the other on nominal samples. At test time, anomalies are detected by pinpointing inconsistencies between observed and mapped features. Extensive experiments show that our approach achieves state-of-the-art detection and segmentation performance in both the standard and few-shot settings on the MVTec 3D-AD dataset while achieving faster inference and occupying less memory than previous multimodal AD methods. Moreover, we propose a layer-pruning technique to improve memory and time efficiency with a marginal sacrifice in performance.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Large Language models (LLMs) can generate complicated source code from natural language prompts. However, LLMs can generate output that deviates from what the user wants, requiring supervision and editing. To support this process, we offer techniques to localize where generations might be misaligned from user intent. We first create a dataset of "Minimal Intent Aligning Patches" of repaired LLM generated programs. Each program uses test cases to verify correctness. After creating a dataset of programs, we measure how well various techniques can assign a well-calibrated probability to indicate which parts of code will be edited in a minimal patch (i.e., give a probability that corresponds with empirical odds it is edited). We compare white-box probing (where we propose a technique for efficient arbitrary-span querying), against black-box reflective and self-consistency based approaches. We find probes with a small supervisor model can achieve low calibration error and Brier Skill Score of approx 0.2 estimating edited lines on code generated by models many orders of magnitude larger. We discuss the generalizability of the techniques, and the connections to AI oversight and control, finding a probe trained only on code shows some signs of generalizing to natural language errors if new probability scaling is allowed.

We present a transformer-based image anomaly detection and localization network. Our proposed model is a combination of a reconstruction-based approach and patch embedding. The use of transformer networks helps to preserve the spatial information of the embedded patches, which are later processed by a Gaussian mixture density network to localize the anomalous areas. In addition, we also publish BTAD, a real-world industrial anomaly dataset. Our results are compared with other state-of-the-art algorithms using publicly available datasets like MNIST and MVTec.

Automated program repair (APR) aims to fix software bugs automatically and plays a crucial role in software development and maintenance. With the recent advances in deep learning (DL), an increasing number of APR techniques have been proposed to leverage neural networks to learn bug-fixing patterns from massive open-source code repositories. Such learning-based techniques usually treat APR as a neural machine translation (NMT) task, where buggy code snippets (i.e., source language) are translated into fixed code snippets (i.e., target language) automatically. Benefiting from the powerful capability of DL to learn hidden relationships from previous bug-fixing datasets, learning-based APR techniques have achieved remarkable performance. In this paper, we provide a systematic survey to summarize the current state-of-the-art research in the learning-based APR community. We illustrate the general workflow of learning-based APR techniques and detail the crucial components, including fault localization, patch generation, patch ranking, patch validation, and patch correctness phases. We then discuss the widely-adopted datasets and evaluation metrics and outline existing empirical studies. We discuss several critical aspects of learning-based APR techniques, such as repair domains, industrial deployment, and the open science issue. We highlight several practical guidelines on applying DL techniques for future APR studies, such as exploring explainable patch generation and utilizing code features. Overall, our paper can help researchers gain a comprehensive understanding about the achievements of the existing learning-based APR techniques and promote the practical application of these techniques. Our artifacts are publicly available at https://github.com/QuanjunZhang/AwesomeLearningAPR.

Visual artifacts remain a persistent challenge in diffusion models, even with training on massive datasets. Current solutions primarily rely on supervised detectors, yet lack understanding of why these artifacts occur in the first place. In our analysis, we identify three distinct phases in the diffusion generative process: Profiling, Mutation, and Refinement. Artifacts typically emerge during the Mutation phase, where certain regions exhibit anomalous score dynamics over time, causing abrupt disruptions in the normal evolution pattern. This temporal nature explains why existing methods focusing only on spatial uncertainty of the final output fail at effective artifact localization. Based on these insights, we propose ASCED (Abnormal Score Correction for Enhancing Diffusion), that detects artifacts by monitoring abnormal score dynamics during the diffusion process, with a trajectory-aware on-the-fly mitigation strategy that appropriate generation of noise in the detected areas. Unlike most existing methods that apply post hoc corrections, \eg, by applying a noising-denoising scheme after generation, our mitigation strategy operates seamlessly within the existing diffusion process. Extensive experiments demonstrate that our proposed approach effectively reduces artifacts across diverse domains, matching or surpassing existing supervised methods without additional training.

Automated Program Repair (APR) is a task to automatically generate patches for the buggy code. However, most research focuses on generating correct patches while ignoring the consistency between the fixed code and the original buggy code. How to conduct adaptive bug fixing and generate patches with minimal modifications have seldom been investigated. To bridge this gap, we first introduce a novel task, namely AdaPR (Adaptive Program Repair). We then propose a two-stage approach AdaPatcher (Adaptive Patch Generator) to enhance program repair while maintaining the consistency. In the first stage, we utilize a Bug Locator with self-debug learning to accurately pinpoint bug locations. In the second stage, we train a Program Modifier to ensure consistency between the post-modified fixed code and the pre-modified buggy code. The Program Modifier is enhanced with a location-aware repair learning strategy to generate patches based on identified buggy lines, a hybrid training strategy for selective reference and an adaptive preference learning to prioritize fewer changes. The experimental results show that our approach outperforms a set of baselines by a large margin, validating the effectiveness of our two-stage framework for the newly proposed AdaPR task.

In this work, we aim to enhance model-based face reconstruction by avoiding fitting the model to outliers, i.e. regions that cannot be well-expressed by the model such as occluders or make-up. The core challenge for localizing outliers is that they are highly variable and difficult to annotate. To overcome this challenging problem, we introduce a joint Face-autoencoder and outlier segmentation approach (FOCUS).In particular, we exploit the fact that the outliers cannot be fitted well by the face model and hence can be localized well given a high-quality model fitting. The main challenge is that the model fitting and the outlier segmentation are mutually dependent on each other, and need to be inferred jointly. We resolve this chicken-and-egg problem with an EM-type training strategy, where a face autoencoder is trained jointly with an outlier segmentation network. This leads to a synergistic effect, in which the segmentation network prevents the face encoder from fitting to the outliers, enhancing the reconstruction quality. The improved 3D face reconstruction, in turn, enables the segmentation network to better predict the outliers. To resolve the ambiguity between outliers and regions that are difficult to fit, such as eyebrows, we build a statistical prior from synthetic data that measures the systematic bias in model fitting. Experiments on the NoW testset demonstrate that FOCUS achieves SOTA 3D face reconstruction performance among all baselines that are trained without 3D annotation. Moreover, our results on CelebA-HQ and the AR database show that the segmentation network can localize occluders accurately despite being trained without any segmentation annotation.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

Facing climate change, the already limited availability of drinking water will decrease in the future rendering drinking water an increasingly scarce resource. Considerable amounts of it are lost through leakages in water transportation and distribution networks. Thus, anomaly detection and localization, in particular for leakages, are crucial but challenging tasks due to the complex interactions and changing demands in water distribution networks. In this work, we analyze the effects of anomalies on the dynamics of critical infrastructure systems by modeling the networks employing Bayesian networks. We then discuss how the problem is connected to and can be considered through the lens of concept drift. In particular, we argue that model-based explanations of concept drift are a promising tool for localizing anomalies given limited information about the network. The methodology is experimentally evaluated using realistic benchmark scenarios. To showcase that our methodology applies to critical infrastructure more generally, in addition to considering leakages and sensor faults in water systems, we showcase the suitability of the derived technique to localize sensor faults in power systems.

Large Language Models (LLMs) often generate code with subtle but critical bugs, especially for complex tasks. Existing automated repair methods typically rely on superficial pass/fail signals, offering limited visibility into program behavior and hindering precise error localization. In addition, without a way to learn from prior failures, repair processes often fall into repetitive and inefficient cycles. To overcome these challenges, we present TraceCoder, a collaborative multi-agent framework that emulates the observe-analyze-repair process of human experts. The framework first instruments the code with diagnostic probes to capture fine-grained runtime traces, enabling deep insight into its internal execution. It then conducts causal analysis on these traces to accurately identify the root cause of the failure. This process is further enhanced by a novel Historical Lesson Learning Mechanism (HLLM), which distills insights from prior failed repair attempts to inform subsequent correction strategies and prevent recurrence of similar mistakes. To ensure stable convergence, a Rollback Mechanism enforces that each repair iteration constitutes a strict improvement toward the correct solution. Comprehensive experiments across multiple benchmarks show that TraceCoder achieves up to a 34.43\% relative improvement in Pass@1 accuracy over existing advanced baselines. Ablation studies verify the significance of each system component, with the iterative repair process alone contributing a 65.61\% relative gain in accuracy. Furthermore, TraceCoder significantly outperforms leading iterative methods in terms of both accuracy and cost-efficiency.

This study presents a deep learning system for breast cancer detection in mammography, developed using a modified EfficientNetV2 architecture with enhanced attention mechanisms. The model was trained on mammograms from a major Thai medical center and validated on three distinct datasets: an in-domain test set (9,421 cases), a biopsy-confirmed set (883 cases), and an out-of-domain generalizability set (761 cases) collected from two different hospitals. For cancer detection, the model achieved AUROCs of 0.89, 0.96, and 0.94 on the respective datasets. The system's lesion localization capability, evaluated using metrics including Lesion Localization Fraction (LLF) and Non-Lesion Localization Fraction (NLF), demonstrated robust performance in identifying suspicious regions. Clinical validation through concordance tests showed strong agreement with radiologists: 83.5% classification and 84.0% localization concordance for biopsy-confirmed cases, and 78.1% classification and 79.6% localization concordance for out-of-domain cases. Expert radiologists' acceptance rate also averaged 96.7% for biopsy-confirmed cases, and 89.3% for out-of-domain cases. The system achieved a System Usability Scale score of 74.17 for source hospital, and 69.20 for validation hospitals, indicating good clinical acceptance. These results demonstrate the model's effectiveness in assisting mammogram interpretation, with the potential to enhance breast cancer screening workflows in clinical practice.

We learn a visual representation that captures information about the camera that recorded a given photo. To do this, we train a multimodal embedding between image patches and the EXIF metadata that cameras automatically insert into image files. Our model represents this metadata by simply converting it to text and then processing it with a transformer. The features that we learn significantly outperform other self-supervised and supervised features on downstream image forensics and calibration tasks. In particular, we successfully localize spliced image regions "zero shot" by clustering the visual embeddings for all of the patches within an image.

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

In spite of recent progress, image diffusion models still produce artifacts. A common solution is to leverage the feedback provided by quality assessment systems or human annotators to optimize the model, where images are generally rated in their entirety. In this work, we believe problem-solving starts with identification, yielding the request that the model should be aware of not just the presence of defects in an image, but their specific locations. Motivated by this, we propose DiffDoctor, a two-stage pipeline to assist image diffusion models in generating fewer artifacts. Concretely, the first stage targets developing a robust artifact detector, for which we collect a dataset of over 1M flawed synthesized images and set up an efficient human-in-the-loop annotation process, incorporating a carefully designed class-balance strategy. The learned artifact detector is then involved in the second stage to optimize the diffusion model by providing pixel-level feedback. Extensive experiments on text-to-image diffusion models demonstrate the effectiveness of our artifact detector as well as the soundness of our diagnose-then-treat design.

Millions of open-source projects with numerous bug fixes are available in code repositories. This proliferation of software development histories can be leveraged to learn how to fix common programming bugs. To explore such a potential, we perform an empirical study to assess the feasibility of using Neural Machine Translation techniques for learning bug-fixing patches for real defects. First, we mine millions of bug-fixes from the change histories of projects hosted on GitHub, in order to extract meaningful examples of such bug-fixes. Next, we abstract the buggy and corresponding fixed code, and use them to train an Encoder-Decoder model able to translate buggy code into its fixed version. In our empirical investigation we found that such a model is able to fix thousands of unique buggy methods in the wild. Overall, this model is capable of predicting fixed patches generated by developers in 9-50% of the cases, depending on the number of candidate patches we allow it to generate. Also, the model is able to emulate a variety of different Abstract Syntax Tree operations and generate candidate patches in a split second.

Because anomalous samples cannot be used for training, many anomaly detection and localization methods use pre-trained networks and non-parametric modeling to estimate encoded feature distribution. However, these methods neglect the impact of position and neighborhood information on the distribution of normal features. To overcome this, we propose a new algorithm, PNI, which estimates the normal distribution using conditional probability given neighborhood features, modeled with a multi-layer perceptron network. Moreover, position information is utilized by creating a histogram of representative features at each position. Instead of simply resizing the anomaly map, the proposed method employs an additional refine network trained on synthetic anomaly images to better interpolate and account for the shape and edge of the input image. We conducted experiments on the MVTec AD benchmark dataset and achieved state-of-the-art performance, with 99.56\% and 98.98\% AUROC scores in anomaly detection and localization, respectively.

Localizing textual descriptions within large-scale 3D scenes presents inherent ambiguities, such as identifying all traffic lights in a city. Addressing this, we introduce a method to generate distributions of camera poses conditioned on textual descriptions, facilitating robust reasoning for broadly defined concepts. Our approach employs a diffusion-based architecture to refine noisy 6DoF camera poses towards plausible locations, with conditional signals derived from pre-trained text encoders. Integration with the pretrained Vision-Language Model, CLIP, establishes a strong linkage between text descriptions and pose distributions. Enhancement of localization accuracy is achieved by rendering candidate poses using 3D Gaussian splatting, which corrects misaligned samples through visual reasoning. We validate our method's superiority by comparing it against standard distribution estimation methods across five large-scale datasets, demonstrating consistent outperformance. Code, datasets and more information will be publicly available at our project page.

Large language models (LLMs) are effective for automated program repair, but plausible patches that pass the full test suite often rewrite more code than necessary, increasing review and maintenance costs. This over-editing is common because most bugs are localized, while standard supervised fine-tuning provides no explicit signal about which tokens should be preserved and which should be changed. We propose PAFT, a preservation-aware fine-tuning method for minimal-edit program repair. PAFT derives token-level preservation signals by aligning buggy and fixed code, combines them with full-sequence masking, and applies an edit-difficulty curriculum. Across Defects4J and HumanEval-Java, PAFT improves pass@1 by up to 65.6% over standard supervised fine-tuning (StdFT) while reducing average edit distance (AED) by up to 32.6%. On Defects4J with DeepSeek-Coder-6.7B, PAFT also outperforms AdaPatcher, a strong preference-based repair baseline, improving pass@1 from 5.9% to 10.1% while reducing median AED from 61.0 to 42.0. Overall, PAFT preserves stable context and concentrates edits on faulty regions, yielding smaller, more localized, plausible patches without inference-time search, reranking, or post-processing.